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media: Documentation: v4l: Improve frame rate configuration documentation
Improve the documentation of the frame rate configuration so that it can be understood by a regular human being. Signed-off-by: Sakari Ailus <sakari.ailus@linux.intel.com> Signed-off-by: Mauro Carvalho Chehab <mchehab+huawei@kernel.org>
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@ -23,19 +23,7 @@ Image Process Control IDs
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.. _v4l2-cid-link-freq:
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``V4L2_CID_LINK_FREQ (integer menu)``
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Data bus frequency. Together with the media bus pixel code, bus type
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(clock cycles per sample), the data bus frequency defines the pixel
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rate (``V4L2_CID_PIXEL_RATE``) in the pixel array (or possibly
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elsewhere, if the device is not an image sensor). The frame rate can
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be calculated from the pixel clock, image width and height and
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horizontal and vertical blanking. While the pixel rate control may
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be defined elsewhere than in the subdev containing the pixel array,
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the frame rate cannot be obtained from that information. This is
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because only on the pixel array it can be assumed that the vertical
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and horizontal blanking information is exact: no other blanking is
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allowed in the pixel array. The selection of frame rate is performed
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by selecting the desired horizontal and vertical blanking. The unit
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of this control is Hz.
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The frequency of the data bus (e.g. parallel or CSI-2).
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.. _v4l2-cid-pixel-rate:
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@ -43,6 +31,15 @@ Image Process Control IDs
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Pixel sampling rate in the device's pixel array. This control is
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read-only and its unit is pixels / second.
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Some devices use horizontal and vertical balanking to configure the frame
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rate. The frame rate can be calculated from the pixel rate, analogue crop
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rectangle as well as horizontal and vertical blanking. The pixel rate
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control may be present in a different sub-device than the blanking controls
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and the analogue crop rectangle configuration.
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The configuration of the frame rate is performed by selecting the desired
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horizontal and vertical blanking. The unit of this control is Hz.
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``V4L2_CID_TEST_PATTERN (menu)``
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Some capture/display/sensor devices have the capability to generate
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test pattern images. These hardware specific test patterns can be
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