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rtc: ds1307: use rtc_add_group

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Register frequency test using rtc_add_group to avoid a possible race
condition and simplify the code.

This also moves the attribute to its proper location under the rtc device
instead of the i2c parent device.

Signed-off-by: Alexandre Belloni <alexandre.belloni@bootlin.com>
This commit is contained in:
Alexandre Belloni 2018-09-20 16:35:26 +02:00
parent cfb74916e2
commit 6a5f2a1f4d
1 changed files with 14 additions and 39 deletions
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45
drivers/rtc/rtc-ds1307.c
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@ -1050,11 +1050,11 @@ static int m41txx_rtc_set_offset(struct device *dev, long offset)
ctrl_reg);
}
static ssize_t frequency_test_enable_store(struct device *dev,
static ssize_t frequency_test_store(struct device *dev,
struct device_attribute *attr,
const char *buf, size_t count)
{
struct ds1307 *ds1307 = dev_get_drvdata(dev);
struct ds1307 *ds1307 = dev_get_drvdata(dev->parent);
bool freq_test_en;
int ret;
@ -1070,11 +1070,11 @@ static ssize_t frequency_test_enable_store(struct device *dev,
return count;
}
static ssize_t frequency_test_enable_show(struct device *dev,
static ssize_t frequency_test_show(struct device *dev,
struct device_attribute *attr,
char *buf)
{
struct ds1307 *ds1307 = dev_get_drvdata(dev);
struct ds1307 *ds1307 = dev_get_drvdata(dev->parent);
unsigned int ctrl_reg;
regmap_read(ds1307->regmap, M41TXX_REG_CONTROL, &ctrl_reg);
@ -1083,10 +1083,10 @@ static ssize_t frequency_test_enable_show(struct device *dev,
"off\n");
}
static DEVICE_ATTR_RW(frequency_test_enable);
static DEVICE_ATTR_RW(frequency_test);
static struct attribute *rtc_freq_test_attrs[] = {
&dev_attr_frequency_test_enable.attr,
&dev_attr_frequency_test.attr,
NULL,
};
@ -1094,13 +1094,6 @@ static const struct attribute_group rtc_freq_test_attr_group = {
.attrs = rtc_freq_test_attrs,
};
static void rtc_calib_remove_sysfs_group(void *_dev)
{
struct device *dev = _dev;
sysfs_remove_group(&dev->kobj, &rtc_freq_test_attr_group);
}
static int ds1307_add_frequency_test(struct ds1307 *ds1307)
{
int err;
@ -1109,27 +1102,9 @@ static int ds1307_add_frequency_test(struct ds1307 *ds1307)
case m41t0:
case m41t00:
case m41t11:
/* Export sysfs entries */
err = sysfs_create_group(&(ds1307->dev)->kobj,
&rtc_freq_test_attr_group);
if (err) {
dev_err(ds1307->dev,
"Failed to create sysfs group: %d\n",
err);
err = rtc_add_group(ds1307->rtc, &rtc_freq_test_attr_group);
if (err)
return err;
}
err = devm_add_action_or_reset(ds1307->dev,
rtc_calib_remove_sysfs_group,
ds1307->dev);
if (err) {
dev_err(ds1307->dev,
"Failed to add sysfs cleanup action: %d\n",
err);
sysfs_remove_group(&(ds1307->dev)->kobj,
&rtc_freq_test_attr_group);
return err;
}
break;
default:
break;
@ -1876,11 +1851,11 @@ read_rtc:
}
ds1307->rtc->ops = chip->rtc_ops ?: &ds13xx_rtc_ops;
err = rtc_register_device(ds1307->rtc);
err = ds1307_add_frequency_test(ds1307);
if (err)
return err;
err = ds1307_add_frequency_test(ds1307);
err = rtc_register_device(ds1307->rtc);
if (err)
return err;