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61ccd886e2
The USB subsystem has a few counters that need to be reset since they are stored in static variables rather than driver-model data. An example is usb_max_devs. Ultimately we should move this data into the USB uclass. For now, make sure that USB is reset after each test, so that the counters go back to zero. Note: this is not a perfect solution: It a USB test fails it will exit immediately and leave USB un-reset. The impact here is that it may cause subsequence test failures in the same run. Signed-off-by: Simon Glass <sjg@chromium.org>
303 lines
7.8 KiB
C
303 lines
7.8 KiB
C
/*
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* Copyright (C) 2015 Google, Inc
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*
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* SPDX-License-Identifier: GPL-2.0+
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*/
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#include <common.h>
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#include <console.h>
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#include <dm.h>
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#include <usb.h>
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#include <asm/io.h>
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#include <asm/state.h>
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#include <asm/test.h>
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#include <dm/device-internal.h>
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#include <dm/test.h>
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#include <dm/uclass-internal.h>
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#include <test/ut.h>
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DECLARE_GLOBAL_DATA_PTR;
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/* Test that sandbox USB works correctly */
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static int dm_test_usb_base(struct unit_test_state *uts)
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{
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struct udevice *bus;
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ut_asserteq(-ENODEV, uclass_get_device_by_seq(UCLASS_USB, 0, &bus));
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ut_assertok(uclass_get_device(UCLASS_USB, 0, &bus));
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ut_asserteq(-ENODEV, uclass_get_device_by_seq(UCLASS_USB, 2, &bus));
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return 0;
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}
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DM_TEST(dm_test_usb_base, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT);
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/*
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* Test that we can use the flash stick. This is more of a functional test. It
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* covers scanning the bug, setting up a hub and a flash stick and reading
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* data from the flash stick.
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*/
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static int dm_test_usb_flash(struct unit_test_state *uts)
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{
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struct udevice *dev;
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struct blk_desc *dev_desc;
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char cmp[1024];
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state_set_skip_delays(true);
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ut_assertok(usb_init());
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ut_assertok(uclass_get_device(UCLASS_MASS_STORAGE, 0, &dev));
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ut_assertok(blk_get_device_by_str("usb", "0", &dev_desc));
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/* Read a few blocks and look for the string we expect */
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ut_asserteq(512, dev_desc->blksz);
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memset(cmp, '\0', sizeof(cmp));
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ut_asserteq(2, blk_dread(dev_desc, 0, 2, cmp));
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ut_assertok(strcmp(cmp, "this is a test"));
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ut_assertok(usb_stop());
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return 0;
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}
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DM_TEST(dm_test_usb_flash, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT);
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/* test that we can handle multiple storage devices */
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static int dm_test_usb_multi(struct unit_test_state *uts)
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{
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struct udevice *dev;
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state_set_skip_delays(true);
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ut_assertok(usb_init());
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ut_assertok(uclass_get_device(UCLASS_MASS_STORAGE, 0, &dev));
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ut_assertok(uclass_get_device(UCLASS_MASS_STORAGE, 1, &dev));
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ut_assertok(uclass_get_device(UCLASS_MASS_STORAGE, 2, &dev));
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ut_assertok(usb_stop());
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return 0;
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}
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DM_TEST(dm_test_usb_multi, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT);
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static int count_usb_devices(void)
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{
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struct udevice *hub;
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struct uclass *uc;
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int count = 0;
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int ret;
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ret = uclass_get(UCLASS_USB_HUB, &uc);
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if (ret)
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return ret;
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uclass_foreach_dev(hub, uc) {
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struct udevice *dev;
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count++;
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for (device_find_first_child(hub, &dev);
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dev;
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device_find_next_child(&dev)) {
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count++;
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}
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}
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return count;
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}
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/* test that we can remove an emulated device and it is then not found */
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static int dm_test_usb_remove(struct unit_test_state *uts)
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{
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struct udevice *dev, *emul;
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/* Scan and check that all devices are present */
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state_set_skip_delays(true);
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ut_assertok(usb_init());
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ut_assertok(uclass_get_device(UCLASS_MASS_STORAGE, 0, &dev));
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ut_assertok(uclass_get_device(UCLASS_MASS_STORAGE, 1, &dev));
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ut_assertok(uclass_get_device(UCLASS_MASS_STORAGE, 2, &dev));
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ut_asserteq(6, count_usb_devices());
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ut_assertok(usb_stop());
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ut_asserteq(6, count_usb_devices());
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/* Remove the second emulation device */
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ut_assertok(uclass_find_device_by_name(UCLASS_USB_EMUL, "flash-stick@1",
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&dev));
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ut_assertok(device_unbind(dev));
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/* Rescan - only the first and third should be present */
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ut_assertok(usb_init());
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ut_assertok(uclass_get_device(UCLASS_MASS_STORAGE, 0, &dev));
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ut_assertok(usb_emul_find_for_dev(dev, &emul));
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ut_asserteq_str("flash-stick@0", emul->name);
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ut_assertok(uclass_get_device(UCLASS_MASS_STORAGE, 1, &dev));
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ut_assertok(usb_emul_find_for_dev(dev, &emul));
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ut_asserteq_str("flash-stick@2", emul->name);
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ut_asserteq(-ENODEV, uclass_get_device(UCLASS_MASS_STORAGE, 2, &dev));
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ut_asserteq(5, count_usb_devices());
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ut_assertok(usb_stop());
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ut_asserteq(5, count_usb_devices());
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return 0;
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}
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DM_TEST(dm_test_usb_remove, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT);
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const char usb_tree_base[] =
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" 1 Hub (12 Mb/s, 100mA)\n"
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" | sandbox hub 2345\n"
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" |\n"
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" |\b+-2 Mass Storage (12 Mb/s, 100mA)\n"
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" | sandbox flash flash-stick@0\n"
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" | \n"
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" |\b+-3 Mass Storage (12 Mb/s, 100mA)\n"
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" | sandbox flash flash-stick@1\n"
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" | \n"
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" |\b+-4 Mass Storage (12 Mb/s, 100mA)\n"
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" | sandbox flash flash-stick@2\n"
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" | \n"
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" |\b+-5 Human Interface (12 Mb/s, 100mA)\n"
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" sandbox keyboard keyb@3\n"
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" \n";
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/* test that the 'usb tree' command output looks correct */
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static int dm_test_usb_tree(struct unit_test_state *uts)
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{
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char *data;
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int len;
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state_set_skip_delays(true);
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ut_assertok(usb_init());
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console_record_reset_enable();
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usb_show_tree();
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len = membuff_getraw(&gd->console_out, -1, true, &data);
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if (len)
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data[len] = '\0';
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ut_asserteq_str(usb_tree_base, data);
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ut_assertok(usb_stop());
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return 0;
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}
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DM_TEST(dm_test_usb_tree, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT);
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const char usb_tree_remove[] =
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" 1 Hub (12 Mb/s, 100mA)\n"
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" | sandbox hub 2345\n"
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" |\n"
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" |\b+-2 Mass Storage (12 Mb/s, 100mA)\n"
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" | sandbox flash flash-stick@0\n"
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" | \n"
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" |\b+-3 Mass Storage (12 Mb/s, 100mA)\n"
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" | sandbox flash flash-stick@2\n"
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" | \n"
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" |\b+-4 Human Interface (12 Mb/s, 100mA)\n"
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" sandbox keyboard keyb@3\n"
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" \n";
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/*
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* test that the 'usb tree' command output looks correct when we remove a
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* device
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*/
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static int dm_test_usb_tree_remove(struct unit_test_state *uts)
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{
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struct udevice *dev;
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char *data;
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int len;
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/* Remove the second emulation device */
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ut_assertok(uclass_find_device_by_name(UCLASS_USB_EMUL, "flash-stick@1",
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&dev));
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ut_assertok(device_unbind(dev));
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state_set_skip_delays(true);
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ut_assertok(usb_init());
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console_record_reset_enable();
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usb_show_tree();
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len = membuff_getraw(&gd->console_out, -1, true, &data);
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if (len)
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data[len] = '\0';
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ut_asserteq_str(usb_tree_remove, data);
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ut_assertok(usb_stop());
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return 0;
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}
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DM_TEST(dm_test_usb_tree_remove, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT);
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const char usb_tree_reorder[] =
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" 1 Hub (12 Mb/s, 100mA)\n"
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" | sandbox hub 2345\n"
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" |\n"
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" |\b+-2 Mass Storage (12 Mb/s, 100mA)\n"
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" | sandbox flash flash-stick@0\n"
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" | \n"
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" |\b+-3 Mass Storage (12 Mb/s, 100mA)\n"
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" | sandbox flash flash-stick@2\n"
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" | \n"
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" |\b+-4 Human Interface (12 Mb/s, 100mA)\n"
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" | sandbox keyboard keyb@3\n"
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" | \n"
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" |\b+-5 Mass Storage (12 Mb/s, 100mA)\n"
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" sandbox flash flash-stick@1\n"
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" \n";
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/*
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* test that the 'usb tree' command output looks correct when we reorder two
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* devices.
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*/
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static int dm_test_usb_tree_reorder(struct unit_test_state *uts)
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{
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struct udevice *dev, *parent;
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char *data;
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int len;
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/* Remove the second emulation device */
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ut_assertok(uclass_find_device_by_name(UCLASS_USB_EMUL, "flash-stick@1",
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&dev));
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parent = dev->parent;
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/* Reorder the devices in the parent list and uclass list */
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list_del(&dev->sibling_node);
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list_add_tail(&dev->sibling_node, &parent->child_head);
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list_del(&dev->uclass_node);
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list_add_tail(&dev->uclass_node, &dev->uclass->dev_head);
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state_set_skip_delays(true);
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ut_assertok(usb_init());
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console_record_reset_enable();
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usb_show_tree();
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len = membuff_getraw(&gd->console_out, -1, true, &data);
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if (len)
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data[len] = '\0';
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ut_asserteq_str(usb_tree_reorder, data);
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ut_assertok(usb_stop());
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return 0;
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}
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DM_TEST(dm_test_usb_tree_reorder, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT);
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static int dm_test_usb_keyb(struct unit_test_state *uts)
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{
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struct udevice *dev;
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state_set_skip_delays(true);
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ut_assertok(usb_init());
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/* Initially there should be no characters */
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ut_asserteq(0, tstc());
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ut_assertok(uclass_get_device_by_name(UCLASS_USB_EMUL, "keyb",
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&dev));
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/*
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* Add a string to the USB keyboard buffer - it should appear in
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* stdin
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*/
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ut_assertok(sandbox_usb_keyb_add_string(dev, "ab"));
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ut_asserteq(1, tstc());
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ut_asserteq('a', getc());
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ut_asserteq(1, tstc());
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ut_asserteq('b', getc());
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ut_asserteq(0, tstc());
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ut_assertok(usb_stop());
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return 0;
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}
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DM_TEST(dm_test_usb_keyb, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT);
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