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dm: core: Fix uclass_probe_all to really probe all devices
uclass_probe_all uses uclass_first_device/uclass_next_device assigning
the return value.
The interface for getting meaningful error is
uclass_first_device_check/uclass_next_device_check, use it.
Also do not stop iteration when an error is encountered. Probing all
devices includes those that happen to be after a failing device in the
uclass order.
Fixes: a59153dfeb
("dm: core: add function uclass_probe_all() to probe all devices")
Signed-off-by: Michal Suchanek <msuchanek@suse.de>
Reviewed-by: Simon Glass <sjg@chromium.org>
This commit is contained in:
parent
e21ec17d42
commit
dfecd63192
@ -799,20 +799,18 @@ int uclass_pre_remove_device(struct udevice *dev)
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int uclass_probe_all(enum uclass_id id)
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{
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struct udevice *dev;
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int ret;
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int ret, err;
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ret = uclass_first_device(id, &dev);
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if (ret || !dev)
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return ret;
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err = uclass_first_device_check(id, &dev);
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/* Scanning uclass to probe all devices */
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while (dev) {
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ret = uclass_next_device(&dev);
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ret = uclass_next_device_check(&dev);
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if (ret)
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return ret;
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err = ret;
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}
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return 0;
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return err;
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}
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int uclass_id_count(enum uclass_id id)
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@ -392,10 +392,10 @@ DM_TEST(dm_test_fdt_offset,
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UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT | UT_TESTF_FLAT_TREE);
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/**
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* Test various error conditions with uclass_first_device() and
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* uclass_next_device()
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* Test various error conditions with uclass_first_device(),
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* uclass_next_device(), and uclass_probe_all()
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*/
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static int dm_test_first_next_device(struct unit_test_state *uts)
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static int dm_test_first_next_device_probeall(struct unit_test_state *uts)
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{
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struct dm_testprobe_pdata *pdata;
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struct udevice *dev, *parent = NULL;
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@ -428,9 +428,20 @@ static int dm_test_first_next_device(struct unit_test_state *uts)
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device_remove(parent, DM_REMOVE_NORMAL);
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ut_asserteq(-ENOENT, uclass_first_device(UCLASS_TEST_PROBE, &dev));
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/* Now that broken devices are set up test probe_all */
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device_remove(parent, DM_REMOVE_NORMAL);
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/* There are broken devices so an error should be returned */
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ut_assert(uclass_probe_all(UCLASS_TEST_PROBE) < 0);
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/* but non-error device should be probed nonetheless */
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ut_assertok(uclass_get_device(UCLASS_TEST_PROBE, 2, &dev));
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ut_assert(dev_get_flags(dev) & DM_FLAG_ACTIVATED);
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ut_assertok(uclass_get_device(UCLASS_TEST_PROBE, 3, &dev));
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ut_assert(dev_get_flags(dev) & DM_FLAG_ACTIVATED);
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return 0;
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}
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DM_TEST(dm_test_first_next_device, UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT);
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DM_TEST(dm_test_first_next_device_probeall,
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UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT);
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/* Test iteration through devices in a uclass */
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static int dm_test_uclass_foreach(struct unit_test_state *uts)
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