dm: test: Add tests for get/find uclass devices

This commit introduces simple tests for functions:
- uclass_find_first_device()
- uclass_find_next_device()
- uclass_first_device()
- uclass_next_device()

Tests added by this commit:
- Test: dm_test_uclass_devices_find:
  * call uclass_find_first_device(), then check if: (dev != NULL), (ret == 0)
  * for the rest devices, call uclass_find_next_device() and do the same check

- Test: dm_test_uclass_devices_get:
  * call uclass_first_device(), then check if:
    -- (dev != NULL), (ret == 0), device_active()
  * for the rest devices, call uclass_next_device() and do the same check

Signed-off-by: Przemyslaw Marczak <p.marczak@samsung.com>
Cc: Simon Glass <sjg@chromium.org>
Acked-by: Simon Glass <sjg@chromium.org>
This commit is contained in:
Przemyslaw Marczak 2015-04-15 13:07:20 +02:00 committed by Simon Glass
parent 754e71e850
commit 9e85f13ddc

View File

@ -656,9 +656,41 @@ static int dm_test_uclass_before_ready(struct dm_test_state *dms)
return 0;
}
DM_TEST(dm_test_uclass_before_ready, 0);
static int dm_test_uclass_devices_find(struct dm_test_state *dms)
{
struct udevice *dev;
int ret;
for (ret = uclass_find_first_device(UCLASS_TEST, &dev);
dev;
ret = uclass_find_next_device(&dev)) {
ut_assert(!ret);
ut_assert(dev);
}
return 0;
}
DM_TEST(dm_test_uclass_devices_find, DM_TESTF_SCAN_PDATA);
static int dm_test_uclass_devices_get(struct dm_test_state *dms)
{
struct udevice *dev;
int ret;
for (ret = uclass_first_device(UCLASS_TEST, &dev);
dev;
ret = uclass_next_device(&dev)) {
ut_assert(!ret);
ut_assert(dev);
ut_assert(device_active(dev));
}
return 0;
}
DM_TEST(dm_test_uclass_devices_get, DM_TESTF_SCAN_PDATA);
static int dm_test_device_get_uclass_id(struct dm_test_state *dms)
{
struct udevice *dev;