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tests/tcg/s390x: Add ex-relative-long.c

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Test EXECUTE and EXECUTE RELATIVE LONG with relative long instructions
as targets.

Signed-off-by: Ilya Leoshkevich <iii@linux.ibm.com>
Reviewed-by: Richard Henderson <richard.henderson@linaro.org>
Reviewed-by: Nina Schoetterl-Glausch <nsg@linux.ibm.com>
Message-Id: <20230316210751.302423-3-iii@linux.ibm.com>
Signed-off-by: Thomas Huth <thuth@redhat.com>
This commit is contained in:
Ilya Leoshkevich 2023-03-16 22:07:51 +01:00 committed by Thomas Huth
parent 703d03a4aa
commit 5e8a0c6291
2 changed files with 157 additions and 0 deletions
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1
tests/tcg/s390x/Makefile.target
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@ -30,6 +30,7 @@ TESTS+=long-double
TESTS+=cdsg TESTS+=cdsg
TESTS+=chrl TESTS+=chrl
TESTS+=rxsbg TESTS+=rxsbg
TESTS+=ex-relative-long
cdsg: CFLAGS+=-pthread cdsg: CFLAGS+=-pthread
cdsg: LDFLAGS+=-pthread cdsg: LDFLAGS+=-pthread

156
tests/tcg/s390x/ex-relative-long.c Normal file
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@ -0,0 +1,156 @@
/* Check EXECUTE with relative long instructions as targets. */
#include <stdlib.h>
#include <stdio.h>
struct test {
const char *name;
long (*func)(long reg, long *cc);
long exp_reg;
long exp_mem;
long exp_cc;
};
/*
* Each test sets the MEM_IDXth element of the mem array to MEM and uses a
* single relative long instruction on it. The other elements remain zero.
* This is in order to prevent stumbling upon MEM in random memory in case
* there is an off-by-a-small-value bug.
*
* Note that while gcc supports the ZL constraint for relative long operands,
* clang doesn't, so the assembly code accesses mem[MEM_IDX] using MEM_ASM.
*/
static long mem[0x1000];
#define MEM_IDX 0x800
#define MEM_ASM "mem+0x800*8"
/* Initial %r2 value. */
#define REG 0x1234567887654321
/* Initial mem[MEM_IDX] value. */
#define MEM 0xfedcba9889abcdef
/* Initial cc value. */
#define CC 0
/* Relative long instructions and their expected effects. */
#define FOR_EACH_INSN(F) \
F(cgfrl, REG, MEM, 2) \
F(cghrl, REG, MEM, 2) \
F(cgrl, REG, MEM, 2) \
F(chrl, REG, MEM, 1) \
F(clgfrl, REG, MEM, 2) \
F(clghrl, REG, MEM, 2) \
F(clgrl, REG, MEM, 1) \
F(clhrl, REG, MEM, 2) \
F(clrl, REG, MEM, 1) \
F(crl, REG, MEM, 1) \
F(larl, (long)&mem[MEM_IDX], MEM, CC) \
F(lgfrl, 0xfffffffffedcba98, MEM, CC) \
F(lghrl, 0xfffffffffffffedc, MEM, CC) \
F(lgrl, MEM, MEM, CC) \
F(lhrl, 0x12345678fffffedc, MEM, CC) \
F(llghrl, 0x000000000000fedc, MEM, CC) \
F(llhrl, 0x123456780000fedc, MEM, CC) \
F(lrl, 0x12345678fedcba98, MEM, CC) \
F(stgrl, REG, REG, CC) \
F(sthrl, REG, 0x4321ba9889abcdef, CC) \
F(strl, REG, 0x8765432189abcdef, CC)
/* Test functions. */
#define DEFINE_EX_TEST(insn, exp_reg, exp_mem, exp_cc) \
static long test_ex_ ## insn(long reg, long *cc) \
{ \
register long r2 asm("r2"); \
char mask = 0x20; /* make target use %r2 */ \
long pm, target; \
\
r2 = reg; \
asm("larl %[target],0f\n" \
"cr %%r0,%%r0\n" /* initial cc */ \
"ex %[mask],0(%[target])\n" \
"jg 1f\n" \
"0: " #insn " %%r0," MEM_ASM "\n" \
"1: ipm %[pm]\n" \
: [target] "=&a" (target), [r2] "+r" (r2), [pm] "=r" (pm) \
: [mask] "a" (mask) \
: "cc", "memory"); \
reg = r2; \
*cc = (pm >> 28) & 3; \
\
return reg; \
}
#define DEFINE_EXRL_TEST(insn, exp_reg, exp_mem, exp_cc) \
static long test_exrl_ ## insn(long reg, long *cc) \
{ \
register long r2 asm("r2"); \
char mask = 0x20; /* make target use %r2 */ \
long pm; \
\
r2 = reg; \
asm("cr %%r0,%%r0\n" /* initial cc */ \
"exrl %[mask],0f\n" \
"jg 1f\n" \
"0: " #insn " %%r0," MEM_ASM "\n" \
"1: ipm %[pm]\n" \
: [r2] "+r" (r2), [pm] "=r" (pm) \
: [mask] "a" (mask) \
: "cc", "memory"); \
reg = r2; \
*cc = (pm >> 28) & 3; \
\
return reg; \
}
FOR_EACH_INSN(DEFINE_EX_TEST)
FOR_EACH_INSN(DEFINE_EXRL_TEST)
/* Test definitions. */
#define REGISTER_EX_EXRL_TEST(ex_insn, insn, _exp_reg, _exp_mem, _exp_cc) \
{ \
.name = #ex_insn " " #insn, \
.func = test_ ## ex_insn ## _ ## insn, \
.exp_reg = (_exp_reg), \
.exp_mem = (_exp_mem), \
.exp_cc = (_exp_cc), \
},
#define REGISTER_EX_TEST(insn, exp_reg, exp_mem, exp_cc) \
REGISTER_EX_EXRL_TEST(ex, insn, exp_reg, exp_mem, exp_cc)
#define REGISTER_EXRL_TEST(insn, exp_reg, exp_mem, exp_cc) \
REGISTER_EX_EXRL_TEST(exrl, insn, exp_reg, exp_mem, exp_cc)
static const struct test tests[] = {
FOR_EACH_INSN(REGISTER_EX_TEST)
FOR_EACH_INSN(REGISTER_EXRL_TEST)
};
/* Loop over all tests and run them. */
int main(void)
{
const struct test *test;
int ret = EXIT_SUCCESS;
long reg, cc;
size_t i;
for (i = 0; i < sizeof(tests) / sizeof(tests[0]); i++) {
test = &tests[i];
mem[MEM_IDX] = MEM;
cc = -1;
reg = test->func(REG, &cc);
#define ASSERT_EQ(expected, actual) do { \
if (expected != actual) { \
fprintf(stderr, "%s: " #expected " (0x%lx) != " #actual " (0x%lx)\n", \
test->name, expected, actual); \
ret = EXIT_FAILURE; \
} \
} while (0)
ASSERT_EQ(test->exp_reg, reg);
ASSERT_EQ(test->exp_mem, mem[MEM_IDX]);
ASSERT_EQ(test->exp_cc, cc);
#undef ASSERT_EQ
}
return ret;
}