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testsuite: Tweak some further tests for modern C changes
On IRC Richi mentioned some FAILs in gcc.target/x86_64 and in pr83126.c. The following patch fixes the former ones (they need recent binutils to be enabled), for pr83126.c because I didn't have graphite configured I've just verified that the test compiles (didn't without the patch) and that the gimple dump is identical with one from yesterday's gcc (as it was a tree-parloops.cc ICE, I guess identical gimple is all we care about and no need to verify it further). 2023-12-01 Jakub Jelinek <jakub@redhat.com> * gcc.target/x86_64/abi/avx512fp16/m512h/test_passing_m512.c (fun_check_passing_m512_8_values, fun_check_passing_m512h_8_values): Add missing void return type. * gcc.target/x86_64/abi/avx512fp16/m256h/test_passing_m256.c (fun_check_passing_m256_8_values, fun_check_passing_m256h_8_values): Likewise. * gcc.dg/graphite/pr83126.c (ew): Add missing casts to __INTPTR_TYPE__ and then to int *.
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@ -12,7 +12,7 @@ ew (unsigned short int c9, int stuff)
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int *fd = &stuff;
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*fd = c9;
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fd = *fd;
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fd = (int *) (__INTPTR_TYPE__) *fd;
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if (*fd != 0)
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for (*by = 0; *by < 2; ++*by)
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c9 *= e1;
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@ -25,6 +25,7 @@ int failed = 0;
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assert (memcmp (&X1, &X2, sizeof (T)) == 0); \
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} while (0)
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void
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fun_check_passing_m256_8_values (__m256 i0 ATTRIBUTE_UNUSED,
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__m256 i1 ATTRIBUTE_UNUSED,
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__m256 i2 ATTRIBUTE_UNUSED,
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@ -45,6 +46,7 @@ fun_check_passing_m256_8_values (__m256 i0 ATTRIBUTE_UNUSED,
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compare (values.i7, i7, __m256);
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}
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void
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fun_check_passing_m256h_8_values (__m256h i0 ATTRIBUTE_UNUSED,
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__m256h i1 ATTRIBUTE_UNUSED,
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__m256h i2 ATTRIBUTE_UNUSED,
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@ -25,6 +25,7 @@ int failed = 0;
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assert (memcmp (&X1, &X2, sizeof (T)) == 0); \
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} while (0)
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void
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fun_check_passing_m512_8_values (__m512 i0 ATTRIBUTE_UNUSED,
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__m512 i1 ATTRIBUTE_UNUSED,
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__m512 i2 ATTRIBUTE_UNUSED,
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@ -45,6 +46,7 @@ fun_check_passing_m512_8_values (__m512 i0 ATTRIBUTE_UNUSED,
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compare (values.i7, i7, __m512);
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}
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void
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fun_check_passing_m512h_8_values (__m512h i0 ATTRIBUTE_UNUSED,
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__m512h i1 ATTRIBUTE_UNUSED,
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__m512h i2 ATTRIBUTE_UNUSED,
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