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Document the debugfs interface for the IIO ad9467 high speed ADC. Signed-off-by: Nuno Sa <nuno.sa@analog.com> Link: https://patch.msgid.link/20240806-dev-ad-debugfs-doc-v1-2-153b882a3f01@analog.com Signed-off-by: Jonathan Cameron <Jonathan.Cameron@huawei.com>
40 lines
1.1 KiB
Plaintext
40 lines
1.1 KiB
Plaintext
What: /sys/kernel/debug/iio/iio:deviceX/calibration_table_dump
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KernelVersion: 6.11
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Contact: linux-iio@vger.kernel.org
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Description:
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This dumps the calibration table that was filled during the
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digital interface tuning process.
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What: /sys/kernel/debug/iio/iio:deviceX/in_voltage_test_mode_available
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KernelVersion: 6.11
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Contact: linux-iio@vger.kernel.org
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Description:
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List all the available test tones:
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- off
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- midscale_short
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- pos_fullscale
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- neg_fullscale
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- checkerboard
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- prbs23
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- prbs9
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- one_zero_toggle
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- user
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- bit_toggle
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- sync
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- one_bit_high
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- mixed_bit_frequency
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- ramp
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Note that depending on the actual device being used, some of the
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above might not be available (and they won't be listed when
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reading the file).
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What: /sys/kernel/debug/iio/iio:deviceX/in_voltageY_test_mode
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KernelVersion: 6.11
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Contact: linux-iio@vger.kernel.org
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Description:
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Writing to this file will initiate one of available test tone on
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channel Y. Reading it, shows which test is running. In cases
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where an IIO backend is available and supports the test tone,
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additional information about the data correctness is given.
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