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37791b6fbe
The previous commit, "of/unittest: early return from test skips tests" exposed broken tests for the of_platform_unpopulate() function. The problem was the populate and depopulate calls were not symmetrical like they were intended to be, and unpopulate depends on the parent device to have it's of_node pointer pointing to the parent device node. Fix these bugs so that the test case works correctly. In the process, the test_bus used as a container for the test devices has been changed from a statically allocated struct device (which is bad) to a properly allocated device with a .release() method (which is good). This stops the test code from being a bad example of abusing the device model. Signed-off-by: Grant Likely <grant.likely@linaro.org> Cc: Frank Rowand <frank.rowand@sonymobile.com> Cc: Pantelis Antoniou <pantelis.antoniou@konsulko.com> Cc: Pawel Moll <pawel.moll@arm.com> |
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.. | ||
unittest-data | ||
address.c | ||
base.c | ||
device.c | ||
dynamic.c | ||
fdt_address.c | ||
fdt.c | ||
irq.c | ||
Kconfig | ||
Makefile | ||
of_mdio.c | ||
of_mtd.c | ||
of_net.c | ||
of_pci_irq.c | ||
of_pci.c | ||
of_private.h | ||
of_reserved_mem.c | ||
overlay.c | ||
pdt.c | ||
platform.c | ||
resolver.c | ||
unittest.c |