When detecting NAND parameters, the code gets a little ugly so that the
logic is obscured. Try to remedy that by moving code to separate functions
that have well-defined purposes.
This patch splits out the simple ID decode functionality, where all the
information regarding NAND size/blocksize/pagesize/oobsize/busw is encoded in
the first two bytes of the ID string.
Signed-off-by: Brian Norris <computersforpeace@gmail.com>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
When detecting NAND parameters, the code gets a little ugly so that the
logic is obscured. Try to remedy that by moving code to separate functions
that have well-defined purposes.
This patch splits out the extended ID decode functionality, which handles
decoding the 3rd-8th ID bytes to determine NAND device parameters.
Signed-off-by: Brian Norris <computersforpeace@gmail.com>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
When detecting NAND parameters, the code gets a little ugly so that the
logic is obscured. Try to remedy that by moving code to separate functions
that have well-defined purposes.
This patch splits the bad block marker options detection into its own function,
away from the other parameters (e.g., chip size, page size, etc.).
Signed-off-by: Brian Norris <computersforpeace@gmail.com>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
Instead of reading 2 bytes then later 8 bytes, we can simply read all 8
bytes from the start.
Signed-off-by: Brian Norris <computersforpeace@gmail.com>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
We don't actually use the 'ret' variable; we set it, test it, and then it dies.
Signed-off-by: Brian Norris <computersforpeace@gmail.com>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
While building an allyesconfig for UML I received this error message(s):
drivers/mtd/nand/docg4.c: In function 'probe_docg4':
drivers/mtd/nand/docg4.c:1272:2: error: implicit declaration of function
'ioremap' [-Werror=implicit-function-declaration]
drivers/mtd/nand/docg4.c:1272:10: warning: assignment makes pointer from
integer without a cast [enabled by default]
drivers/mtd/nand/docg4.c:1327:2: error: implicit declaration of function
'iounmap' [-Werror=implicit-function-declaration]
which is caused by the missing implementations on UML.
This patch adds this missing HAS_IOMEM dependency and prevents the driver from
being build on platforms with no HAS_IOMEM
Signed-off-by: Peter Huewe <peterhuewe@gmx.de>
Acked-by: Mike Dunn <mikedunn@newsguy.com>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
The current code initializes the timing registers at very time
we call the gpmi_begin(). This really wastes the cpu cycles.
Add a new flag to let the gpmi driver initializes the timing registers
only one time.
Signed-off-by: Huang Shijie <b32955@freescale.com>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
When the frequency on the nand chip pins is above 33MHz,
the nand EDO(extended Data Out) timing could be applied.
The GPMI implements a Feedback read strobe to sample the read data in
the EDO timing mode.
This patch adds the EDO feature for the gpmi-nand driver.
For some onfi nand chips, the mode 4 is the fastest;
while for other onfi nand chips, the mode 5 is the fastest.
This patch only adds the support for the fastest asynchronous timing mode.
So this patch only supports the mode 4 and mode 5.
I tested several Micron's ONFI nand chips with EDO enabled,
take Micron MT29F32G08MAA for example (in mode 5, 100MHz):
1) The test result BEFORE we add the EDO feature:
=================================================
mtd_speedtest: MTD device: 2
mtd_speedtest: MTD device size 209715200, eraseblock size 524288,
page size 4096, count of eraseblocks 400,
pages per eraseblock 128, OOB size 218
.......................................
mtd_speedtest: testing eraseblock read speed
mtd_speedtest: eraseblock read speed is 3632 KiB/s
.......................................
mtd_speedtest: testing page read speed
mtd_speedtest: page read speed is 3554 KiB/s
.......................................
mtd_speedtest: testing 2 page read speed
mtd_speedtest: 2 page read speed is 3592 KiB/s
.......................................
=================================================
2) The test result AFTER we add the EDO feature:
=================================================
mtd_speedtest: MTD device: 2
mtd_speedtest: MTD device size 209715200, eraseblock size 524288,
page size 4096, count of eraseblocks 400,
pages per eraseblock 128, OOB size 218
.......................................
mtd_speedtest: testing eraseblock read speed
mtd_speedtest: eraseblock read speed is 19555 KiB/s
.......................................
mtd_speedtest: testing page read speed
mtd_speedtest: page read speed is 17319 KiB/s
.......................................
mtd_speedtest: testing 2 page read speed
mtd_speedtest: 2 page read speed is 18339 KiB/s
.......................................
=================================================
3) The read data performance is much improved by more then 5 times.
Signed-off-by: Huang Shijie <b32955@freescale.com>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
The default frequencies of the extra clocks are 200MHz.
The current code sets the extra clocks to 44.5MHz.
When i add the EDO feature to gpmi, i have to revert the extra clocks
to 200MHz.
So it is better that we do not set the default values for the extra
clocks. The driver runs well even when we do not set the default values for
extra clocks.
Signed-off-by: Huang Shijie <b32955@freescale.com>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
The setting DLL code is a little mess.
Just simplify the code and the comments.
Signed-off-by: Huang Shijie <b32955@freescale.com>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
add the WRN_DLY_SEL field for HW_GPMI_CTRL1.
This field is used as delay for gpmi write strobe.
Signed-off-by: Huang Shijie <b32955@freescale.com>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
The current code will gets the clock frequency which is used by
gpmi_nfc_compute_hardware_timing(). It makes the code a little mess.
So move the `get clock frequency` code to the
gpmi_nfc_compute_hardware_timing() itself. This makes the code tidy
and clean.
This patch also uses the macro NSEC_PER_SEC to replace the `1000000000`.
Signed-off-by: Huang Shijie <b32955@freescale.com>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
The gpmi_nfc_compute_hardware_timing{} should contains all the
fields setting for gpmi timing registers. It already contains the fields
for HW_GPMI_TIMING0 and HW_GPMI_CTRL1.
So it is better to add a new field setting for HW_GPMI_TIMING1 in
this data structure. This makes the code more clear in logic.
This patch also changes some comments to make the code more readable.
Signed-off-by: Huang Shijie <b32955@freescale.com>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
Add the set-features(0xef)/get-features(0xee) helpers for ONFI nand.
Also add the necessary macros.
Signed-off-by: Huang Shijie <b32955@freescale.com>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
If override size is too big, the module was actually loaded instead of
failing, because retval was not set.
This lead to memory corruption with the use of the freed structs nandsim
and nand_chip.
Cc: stable@vger.kernel.org
Signed-off-by: Richard Genoud <richard.genoud@gmail.com>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
Currently the docg4's ecc.read_page() method returns -EBADMSG when
uncorrectable bitflips occur. This is wrong; 0 should be returned in
this case. An error code should only be returned by this method in the
case of a hardware error (probably -EIO).
Signed-off-by: Mike Dunn <mikedunn@newsguy.com>
Acked-by: Brian Norris <computersforpeace@gmail.com>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
In nand_bbt.c, a hardcoded value was used instead of the define meant
for that, so we use the define.
There's no functional change.
Signed-off-by: Richard Genoud <richard.genoud@gmail.com>
Acked-by: Brian Norris <computersforpeace@gmail.com>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
This driver is being removed as part of the cleanup of the bcmring
SoC from mainline as it is no longer maintained.
Signed-off-by: Christian Daudt <csd@broadcom.com>
Reviewed-by: Jiandong Zheng <jdzheng@broadcom.com>
Acked-by: Will Deacon <will.deacon@arm.com>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
As a first step towards migrating davinci platforms to use common clock
framework, replace all instances of clk_enable() with clk_prepare_enable()
and clk_disable() with clk_disable_unprepare(). Until the platform is
switched to use the CONFIG_HAVE_CLK_PREPARE Kconfig variable, this just
adds a might_sleep() call and would work without any issues.
This will make it easy later to switch to common clk based implementation
of clk driver from DaVinci specific driver.
Signed-off-by: Murali Karicheri <m-karicheri2@ti.com>
Reviewed-by: Mike Turquette <mturquette@linaro.org>
Acked-by: Mike Turquette <mturquette@linaro.org>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
This adds the double bit error detection test cases listed below:
* Prepare data block with double bit error and ECC data without
corruption, and verify that the uncorrectable error is detected by
__nand_correct_data().
* Prepare data block with single bit error and ECC data with single bit
error, and verify that the uncorrectable error is detected.
* Prepare data block without corruption and ECC data with double bit
error, and verify that the uncorrectable error is detected.
Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
This adds the single bit error correction test case listed below:
Prepare data block without corruption and ECC data with single bit error,
and verify that the data block is preserved by __nand_correct_data().
Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
This adds no corruptin test case listed below:
Prepare data block and ECC data with no corruption, and verify that
the data block is preserved by __nand_correct_data()
Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
This rewrites the entire test routine in order to make it easy to add more
tests by later changes and minimize duplication of each tests as much as
possible.
Now that each test is described by the members of struct nand_ecc_test:
- name: descriptive testname
- prepare: function to prepare data block and ecc with artifical corruption
- verify: function to verify the result of correcting data block
Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
Currently inject_single_bit_error() is used to inject single bit error
into randomly selected bit position of the 256 or 512 bytes data block.
Later change will add tests which inject bit errors into the ecc code.
Unfortunately, inject_single_bit_error() doesn't work for the ecc code
which is not a multiple of sizeof(unsigned long).
Because bit fliping at random position is done by __change_bit().
For example, flipping bit position 0 by __change_bit(0, addr) modifies
3rd byte (32bit) or 7th byte (64bit) on big-endian systems.
Using little-endian version of bitops can fix this issue. But
little-endian version of __change_bit is not yet available.
So this defines __change_bit_le() locally in a similar fashion to
asm-generic/bitops/le.h and use it.
Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
This tests ECC biterror recovery on a single NAND page. Mostly intended
to test ECC hardware and low-level NAND driver.
There are two test modes:
0 - artificially inserting bit errors until the ECC fails
This is the default method and fairly quick. It should
be independent of the quality of the FLASH.
1 - re-writing the same pattern repeatedly until the ECC fails.
This method relies on the physics of NAND FLASH to eventually
generate '0' bits if '1' has been written sufficient times. Depending
on the NAND, the first bit errors will appear after 1000 or
more writes and then will usually snowball, reaching the limits
of the ECC quickly.
The test stops after 10000 cycles, should your FLASH be exceptionally
good and not generate bit errors before that. Try a different page
offset in that case.
Please note that neither of these tests will significantly 'use up' any FLASH
endurance. Only a maximum of two erase operations will be performed.
Signed-off-by: Iwo Mergler <Iwo.Mergler@netcommwireless.com.au>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
Huang Shijie <shijie8@gmail.com> explains:
Assume we have a 1GiB(8Gib) NAND chip, and we set the partitions
in the command line like this:
#gpmi-nand:100m(boot),100m(kernel),1g(rootfs)
In this case, the partition truncating occurs. The current code will
get the following result:
----------------------------------
root@freescale ~$ cat /proc/mtd
dev: size erasesize name
mtd0: 06400000 00040000 "boot"
mtd1: 06400000 00040000 "kernel"
----------------------------------
It is obvious that we lost the truncated partition `rootfs` which should
be 824MiB in this case.
Also, forbid 0-sized partitions.
Signed-off-by: Shmulik Ladkani <shmulik.ladkani@gmail.com>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
With the new i.mx clock framework the mxc_nand clock is registered as:
clk_register_clkdev(clk[nfc_gate], NULL, "mxc_nand");0")
So we do not need to pass "nfc" string and can use NULL instead.
Signed-off-by: Fabio Estevam <fabio.estevam@freescale.com>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
Using module_platform_driver() makes the code smaller and cleaner.
Signed-off-by: Fabio Estevam <fabio.estevam@freescale.com>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
Using module_platform_driver() makes the code smaller and cleaner.
Signed-off-by: Fabio Estevam <fabio.estevam@freescale.com>
Reviewed-by: Marek Vasut <marex@denx.de>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
Quoting from the datasheet for S25FL064P, rev. 05, Nov 18 2011, § 9.17:
"A 64 kB[sic] sector erase (D8h) command issued on 4 kB or 8 kB erase
sectors will erase all sectors in the specified 64 kB region. However,
please note that a 4 kB sector erase (20h) or 8 kB sector erase (40h)
command will not work on a 64 kB sector."
Referring further to Table 8.1 and Table 8.2, it is clearly seen
that most of the sectors are 64KiB; therefore disable this 4KiB
erase support since it's valid only on first/last sectors.
Signed-off-by: Marek Vasut <marex@denx.de>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
This registers MTD driver for serial flash platform device. Right now it
supports reading only, writing still has to be implemented.
Artem: minor amendments.
Signed-off-by: Rafał Miłecki <zajec5@gmail.com>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
Currently the data blocks which is used to test single bit error
correction is allocated statically and injecting single bit error is
implemented by using __change_bit() which must operate on the memory
aligned to the size of an "unsigned long". But there is no such
guarantee for statically allocated array.
This fix the issue by allocating the data block dynamically by
kmalloc(). It also allocate the ecc code dynamically instead of
allocating statically on stack.
The reason to allocate the ecc code dynamically is that later change
will add tests which inject bit errors into the ecc code by bitops.
Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
This includes the message related changes:
- Use pr_* instead of printk
- Print hexdump of ECC code if test fails
- Change log level for hexdump of data from KERN_DEBUG to KERN_INFO
- Factor out the hexdump code into a separate function
Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
Return -EINVAL instead of -1 (-EPERM) when test fails.
Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
Including linux/jiffies.h was required for calling srandom32(jiffies)
that has already been removed.
Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
devm free functions should not have to be explicitly used.
Signed-off-by: Julia Lawall <Julia.Lawall@lip6.fr>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
Clean-up the driver a bit to make it easier to read and amend the coding style.
Mostly these are changes like:
if (a)
{
}
=>
if (a) {
}
Some extra blank lines were added.
Indentation was changed to use tabs instead of spaces.
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
This patch revises and fixes error handling in the command line mtd
partitions parser. Namely:
1. we ignored return code of 'mtdpart_setup_real()'.
2. instead of returning 0 for failure and 1 for success, teach
'mtdpart_setup_real()' to return real error codes.
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
This driver provides parser detecting partitions on BCM47XX flash
memories. It has many differences in comparison to BCM63XX, like:
1) Different CFE with no more trivial MAGICs
2) More partitions types (board_data, ML, POT)
3) Supporting more than 1 flash on a device
which resulted in decision of writing new parser.
It uses generic mtd interface and was successfully tested with Netgear
WNDR4500 router which has 2 flash memories: serial one and NAND one.
Signed-off-by: Rafał Miłecki <zajec5@gmail.com>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
We do not have to initialize variables for .bss to 0 in Linux.
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
Unloading the omap2 nand driver missed to release the memory region which will
result in not being able to request it again if one want to load the driver
later on.
This patch fixes following error when loading omap2 module after unloading:
---8<---
~ $ rmmod omap2
~ $ modprobe omap2
[ 37.420928] omap2-nand: probe of omap2-nand.0 failed with error -16
~ $
--->8---
This error was introduced in 67ce04bf27 which
was the first commit of this driver.
Signed-off-by: Andreas Bießmann <andreas@biessmann.de>
Cc: stable@vger.kernel.org
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
Unlocking may take up to 1.4 seconds on some Intel flashes. So
lets use a max. of 1.5 seconds (1500ms) as timeout.
See "Clear Block Lock-Bits Time" on page 40 in
"3 Volt Intel StrataFlash Memory" 28F128J3,28F640J3,28F320J3 manual
from February 2003
This patch also fixes some other problems with this timeout:
- Don't use HZ in timeout "calculation"!
While testing we noticed that an unlocking timeout occured with
HZ=1000 and didn't occur with HZ=300. This was because the
timeout parameter was calculated differently depending on the
HZ value. Now a fixed value of 1500ms is used.
- The last parameter of WAIT_TIMEOUT (defined to
inval_cache_and_wait_for_operation) has to be passed in
micro-seconds. So multiply the ms value with 1000 and not 100
to calculate this value.
- Use variable name "mdelay" instead of misleading "udelay".
Signed-off-by: Stefan Roese <sr@denx.de>
Tested-by: Stephan Gatzka <stephan@gatzka.org>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
Added a NAND device flag for subpage read support. Previously this was
hard coded based on large page and soft ECC.
Updated base NAND driver to use the new subpage read flag if the NAND is
large page and soft ECC.
Signed-off-by: Jeff Westfahl <jeff.westfahl@ni.com>
Reviewed-by: Brian Norris <computersforpeace@gmail.com>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
Commit abcda1dc ('arm: plat-orion: introduce PLAT_ORION_LEGACY hidden
config option') currently pending in linux-next will make the ARCH_MVEBU
platform select PLAT_ORION, which means that now all Orion drivers can
be enabled on ARCH_MVEBU. This works fine for most drivers, except for
orion_nand, because it includes <mach/hardware.h>, but mach-mvebu does
not have a mach/hardware.h header (it is considered as a deprecated
practice).
It turns out that the <mach/hardware.h> include in orion_nand is not
necessary: the driver builds perfectly fine without it, so we simply
get rid of it.
Signed-off-by: Thomas Petazzoni <thomas.petazzoni@free-electrons.com>
Tested-by: Andrew Lunn <andrew@lunn.ch>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
Return an error code if test fails in order to detect a test case failure
by invoking tests repeatedly like this:
while sudo modprobe mtd_nandecctest; do
sudo modprobe -r mtd_nandecctest
done
Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
It is unnecessary for this driver to call srandom32() in module_init.
Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
