The DT of_device.h and of_platform.h date back to the separate
of_platform_bus_type before it as merged into the regular platform bus.
As part of that merge prepping Arm DT support 13 years ago, they
"temporarily" include each other. They also include platform_device.h
and of.h. As a result, there's a pretty much random mix of those include
files used throughout the tree. In order to detangle these headers and
replace the implicit includes with struct declarations, users need to
explicitly include the correct includes.
Signed-off-by: Rob Herring <robh@kernel.org>
Link: https://lore.kernel.org/r/20230714174930.4063320-1-robh@kernel.org
Signed-off-by: Mark Brown <broonie@kernel.org>
After commit b8a1a4cd5a ("i2c: Provide a temporary .probe_new()
call-back type"), all drivers being converted to .probe_new() and then
03c835f498 ("i2c: Switch .probe() to not take an id parameter") convert
back to (the new) .probe() to be able to eventually drop .probe_new() from
struct i2c_driver.
Signed-off-by: Uwe Kleine-König <u.kleine-koenig@pengutronix.de
Link: https://lore.kernel.org/r/20230505220218.1239542-1-u.kleine-koenig@pengutronix.de
Signed-off-by: Mark Brown <broonie@kernel.org
This follows on the change ("regulator: Set PROBE_PREFER_ASYNCHRONOUS
for drivers that existed in 4.14") but changes regulators didn't exist
in Linux 5.4 but did exist in Linux 5.10.
Signed-off-by: Douglas Anderson <dianders@chromium.org>
Link: https://lore.kernel.org/r/20230316125351.4.I01f21c98901641a009890590ddc1354c0f294e5e@changeid
Signed-off-by: Mark Brown <broonie@kernel.org>
Since commit 0166dc11be ("of: make CONFIG_OF user selectable"), it
is possible to test-build any driver which depends on OF on any
architecture by explicitly selecting OF. Therefore depending on
COMPILE_TEST as an alternative is no longer needed.
It is actually better to always build such drivers with OF enabled,
so that the test builds are closer to how each driver will actually be
built on its intended target. Building them without OF may not test
much as the compiler will optimize out potentially large parts of the
code. In the worst case, this could even pop false positive warnings.
Dropping COMPILE_TEST here improves the quality of our testing and
avoids wasting time on non-existent issues.
As a minor optimization, this also lets us drop several occurrences of
of_match_ptr(), __maybe_unused and some ifdef guarding, as we now know
what all of this will resolve to, we might as well save cpp some work.
Signed-off-by: Jean Delvare <jdelvare@suse.de>
Cc: Liam Girdwood <lgirdwood@gmail.com>
Cc: Mark Brown <broonie@kernel.org>
Cc: Icenowy Zheng <icenowy@aosc.io>
Link: https://lore.kernel.org/r/20221124144708.64371b98@endymion.delvare
Signed-off-by: Mark Brown <broonie@kernel.org>
Enable regmap cache to reduce i2c transactions and corresponding
interrupts if regulator is accessed frequently. Since the register map
is small, we use a FLAT regmap cache.
Signed-off-by: Jisheng Zhang <Jisheng.Zhang@synaptics.com>
Link: https://lore.kernel.org/r/20210803165211.3b00db29@xhacker.debian
Signed-off-by: Mark Brown <broonie@kernel.org>
Fixing W=1 build warning when no support for device tree is there.
Reported-by: kernel test robot <lkp@intel.com>
Signed-off-by: Jisheng Zhang <Jisheng.Zhang@synaptics.com>
Link: https://lore.kernel.org/r/20200810095753.59ce9f75@xhacker.debian
Signed-off-by: Mark Brown <broonie@kernel.org>
The SY8827N from Silergy Corp is a single output DC/DC converter. The
voltage can be controlled via I2C.
Signed-off-by: Jisheng Zhang <Jisheng.Zhang@synaptics.com>
Link: https://lore.kernel.org/r/20200702171438.20edc523@xhacker.debian
Signed-off-by: Mark Brown <broonie@kernel.org>
