thermal: broadcom: Use thermal_zone_get_crit_temp() in bcm2835_thermal_probe()

Modify the bcm2835 thermal driver to use thermal_zone_get_crit_temp() in
bcm2835_thermal_probe() instead of relying on the assumption that the
critical trip index will always be 0.

Signed-off-by: Rafael J. Wysocki <rafael.j.wysocki@intel.com>
Reviewed-by: Florian Fainelli <florian.fainelli@broadcom.com>
Reviewed-by: Lukasz Luba <lukasz.luba@arm.com>
Link: https://patch.msgid.link/3322893.aeNJFYEL58@rjwysocki.net
This commit is contained in:
Rafael J. Wysocki 2024-07-29 17:53:59 +02:00
parent a090742289
commit 5df9809c42

View File

@ -208,8 +208,7 @@ static int bcm2835_thermal_probe(struct platform_device *pdev)
*/
val = readl(data->regs + BCM2835_TS_TSENSCTL);
if (!(val & BCM2835_TS_TSENSCTL_RSTB)) {
struct thermal_trip trip;
int offset, slope;
int offset, slope, crit_temp;
slope = thermal_zone_get_slope(tz);
offset = thermal_zone_get_offset(tz);
@ -217,7 +216,7 @@ static int bcm2835_thermal_probe(struct platform_device *pdev)
* For now we deal only with critical, otherwise
* would need to iterate
*/
err = thermal_zone_get_trip(tz, 0, &trip);
err = thermal_zone_get_crit_temp(tz, &crit_temp);
if (err < 0) {
dev_err(dev, "Not able to read trip_temp: %d\n", err);
return err;
@ -232,7 +231,7 @@ static int bcm2835_thermal_probe(struct platform_device *pdev)
val |= (0xFE << BCM2835_TS_TSENSCTL_RSTDELAY_SHIFT);
/* trip_adc value from info */
val |= bcm2835_thermal_temp2adc(trip.temperature,
val |= bcm2835_thermal_temp2adc(crit_temp,
offset,
slope)
<< BCM2835_TS_TSENSCTL_THOLD_SHIFT;